Advanced Microscopy and Materials Characterization Facility – GLIER
2990 Riverside Drive West, Winsdsor, ON, N9C 1A2
Focus Areas
Scanning electron microscopy; Energy dispersive spectroscopy-EDS (X-Ray analysis); Cathodoluminescence on SEM; Carbon coating; Raman spectroscopy; Atomic force microscopy (AFM); Scanning near field optical microscopy (SNOM); True SurfaceTM profilometry; Fluorescence microscopy; Light microscopy; Sample preparation advice and assistance, training on all equipment