Ontario Centre for the Characterisation of Advanced Materials (OCCAM)
Wallberg Memorial Building, 200 College Street, Toronto ON M5S 3E5
Focus Areas
X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), (environmental) transmission electron microscopy (E-TEM), electron energy loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDX), electron backscatter diffraction (EBSD), secondary ion mass spectrometry (ToF-SIMS), low energy ion scattering (LEIS), scanning Auger microscopy (SAM), focused ion beam microscopy (FIB), ultraviolet and inverse photoelectron spectroscopy (UPS, iPES), atomic force microscopy (AFM), infrared spectroscopy (IR), profilometry, sample prep. (sectioning, polishing, (cryo) ultramicrotomy, coating)