McMaster Analytical X-ray Diffraction Facility (MAX)
Arthur N. Bourns Science Building (ABB), 1280 Main Street West, Hamilton, ON L8S 4M1
Focus Areas
Single Crystal Diffraction (SCD); Determining solid state structures, and molecular structures (inorganic, metal organic, organic, polymeric); Developed a software package (MAX3D) which allows us to study diffraction data in detail in three dimensions; Identifying regions of diffuse scattering, incommensurate scattering, twinning, or Bragg spot distortions.; Texture and Residual Stress Analyses (XRD3); Using area detectors for efficient scanning of reciprocal space for diffraction from polycrystalline solids; Developed unique techniques for quality and orientation analyses of electronic thin films and nanowire surfaces, including visualization of the full diffraction pattern, and real-time scanning of raw pole figures (MAX3D).; Performing quantitative component orientation distribution analyses, using Bruker’s Texture software or the MTex module in MATLab.; Residual stress analysis with area detector data.